The VTE-3100E is the #1 choice world-wide for official compliance and engineering test solutions for Flash memory cards. The system also supports all common NAND devices on the market. The VTE-3100E offers more flexibility than any other tester on the market, supporting the current Flash cards on the market. The VTE-3100E can be configured internally under software control with customized test processors, supporting any type of Flash memory storage device, and offering true real-time test capabilities. A Protocol Analyzer configuration of the VTE-3100Eis also offered, supporting current flash memory storage and host devices. Features: ? Adapters available for: UHS-I SD, eMMC, eMCP or NAND Flash memory storage devices ? The compact size and USB interface make the VTE-3100 a portable, easy-to-install engineering tool 深圳市锐测电子科技有限公司 联系人: 朱琳 Tel: ? Clock Speeds up to 208Mhz+ ? Supports Vdd voltages from 0.8 to 5V ? Supports 1/4/8/16 bit data bus ? True RMS Idd Current Measurement ? Clock shift capability versus data/control **s with 50pS resolution ? Windows Vista, Windows 7 or Windows 8 operating systems supported ? Scripts ** compatible with production testers Above: VTE-3100E with VTE Protocol Analyzer Pass-Through Cable Inserted into Host Device Above: VTE-3100E test adapter supporting UHS-1 SD cards, HS-MMC cards and a multi-socket uBGA adapter supporting all eMMC BGA package types Above: Actual VTE-3100E Test SW Library Screen Capture with optional embedd Protocol Analyzer Above: Actual VTE-3100E with dual socket adapte